IEEE - Institute of Electrical and Electronics Engineers, Inc. - Low Power Oriented Test Modification and Compression Techniques for Scan Based Core Testing

2006 IEEE 15th Asian Test Symposium

Author(s): T. Hayashi ; N. Ikeda ; T. Shinogi ; H. Takase ; H. Kita
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: Fukuoka, Japan
Conference Date: 20 November 2006
Page(s): 327 - 332
ISBN (Paper): 0-7695-2628-4
ISSN (Electronic): 2377-5386
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.2006.260951
Regular:

This paper proposes effective techniques for reducing not only test data volume but also scan-in transitions that are closely related to power dissipation. First, a new test smoothing algorithm... View More

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