IEEE - Institute of Electrical and Electronics Engineers, Inc. - Interconnect Open Defect Diagnosis with Physical Information

2006 IEEE 15th Asian Test Symposium

Author(s): Wei Zou ; Wu-Tung Cheng ; S.M. Reddy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: Fukuoka, Japan
Conference Date: 20 November 2006
Page(s): 203 - 209
ISBN (Paper): 0-7695-2628-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.2006.261021
Regular:

Circuit behavior in the presence of interconnect open defects is affected by four major factors: the capacitances between the floating node and its neighboring nodes, the capacitances inside... View More

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