IEEE - Institute of Electrical and Electronics Engineers, Inc. - Foreword

2006 IEEE 15th Asian Test Symposium

Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: Fukuoka, Japan
Conference Date: 20 November 2006
ISBN (Paper): 0-7695-2628-4
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.2006.260976
Regular:

Presents the welcome message from the conference proceedings.

Advertisement