IEEE - Institute of Electrical and Electronics Engineers, Inc. - Risk Factors for Apgar Score using Artificial Neural Networks

Conference Proceedings. Annual International Conference of the IEEE Engineering in Medicine and Biology Society

Author(s): D. Ibrahim ; M. Frize ; R.C. Walker
Sponsor(s): IEEE EMB
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2006
Conference Location: New York, NY, USA
Conference Date: 30 August 2006
Page(s): 6,109 - 6,112
ISBN (CD): 1-4244-003303
ISBN (Paper): 1-4244-0032-5
ISSN (Paper): 1557-170X
DOI: 10.1109/IEMBS.2006.259591
Regular:

Artificial Neural Networks (ANNs) have been used in identifying the risk factors for many medical outcomes. In this paper, the risk factors for low Apgar score are introduced. This is the first... View More

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