IEEE - Institute of Electrical and Electronics Engineers, Inc. - Identifying risk factors for two complication types for neonatal intensive care patients (NICU)

Conference Proceedings. Annual International Conference of the IEEE Engineering in Medicine and Biology Society

Author(s): M. Frize ; R.C. Walker ; D. Ibrahim
Sponsor(s): IEEE EMB
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2006
Conference Location: New York, NY, USA
Conference Date: 30 August 2006
Page(s): 2,324 - 2,327
ISBN (CD): 1-4244-003303
ISBN (Paper): 1-4244-0032-5
ISSN (Paper): 1557-170X
DOI: 10.1109/IEMBS.2006.259349
Regular:

This paper discusses the results of applying artificial neural networks to predicting complication for neonatal intensive care patients. Risk factors that lead to necrotizing entero-colitis or... View More

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