IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Definition of Reduction in Rough Sets

Proceedings of 2006 International Conference on Machine Learning and Cybernetics

Author(s): Shi-Xin Zhao ; Xiang-Hong Li ; Na Chen ; Qun-Feng Zhang
Sponsor(s): IEEE Syst., Man and Cybernetics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2006
Conference Location: Dalian, China, China
Conference Date: 13 August 2006
Page(s): 2,324 - 2,328
ISBN (Paper): 1-4244-0061-9
ISSN (Electronic): 2160-1348
ISSN (Paper): 2160-133X
DOI: 10.1109/ICMLC.2006.258719
Regular:

This paper proposes a new definition of reduction in rough sets, which follows naturally from the concepts of the degree of similarity and the degree of inconsistency. The new definition is... View More

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