IEEE - Institute of Electrical and Electronics Engineers, Inc. - Safety assessment for safety-critical systems including physical faults and design faults

Annual Reliability and Maintainability Symposium - 2006 Proceedings

Author(s): Yangyang Yu ; B.W. Johnson
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Newport Beach, CA, USA
Conference Date: 23 January 2006
Page Count: 6
Page(s): 588 - 593
ISBN (Paper): 1-4244-0007-4
ISBN (Online): 1-4244-0008-2
ISSN (Paper): 0149-144X
DOI: 10.1109/RAMS.2006.1677437
Regular:

Two types of faults, design faults and physical faults, are discussed in this paper. Since they are two mutually exclusive and complete fault types on the fault space, the safety assessment of... View More

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