IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accident cause analysis of complex systems based on safety control functions

Annual Reliability and Maintainability Symposium - 2006 Proceedings

Author(s): T. Kohda ; Y. Takagi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Newport Beach, CA, USA
Conference Date: 23 January 2006
Page Count: 7
Page(s): 570 - 576
ISBN (Paper): 1-4244-0007-4
ISBN (Online): 1-4244-0008-2
ISSN (Paper): 0149-144X
DOI: 10.1109/RAMS.2006.1677434
Regular:

State of the art computers have made many technology-based systems so complex that new types of accidents now result from dysfunctional interactions between system components, further adding to... View More

Advertisement