IEEE - Institute of Electrical and Electronics Engineers, Inc. - The risks of applying qualitative reliability prediction methods: a case study

Annual Reliability and Maintainability Symposium - 2006 Proceedings

Author(s): I.M. de Visser ; J.A. van den Bogaard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Newport Beach, CA, USA
Conference Date: 23 January 2006
Page Count: 7
Page(s): 532 - 538
ISBN (Paper): 1-4244-0007-4
ISBN (Online): 1-4244-0008-2
ISSN (Paper): 0149-144X
DOI: 10.1109/RAMS.2006.1677428
Regular:

The fast technological innovation of the past decades contributed to an increasing complexity in products. This increased product complexity together with four different business drivers (time,... View More

Advertisement