IEEE - Institute of Electrical and Electronics Engineers, Inc. - Predicting lead sheath cable failures

Conference Record of the 2006 IEEE International Symposium on Electrical Insulation

Author(s): V.J. Ammirato ; J. Silecchia ; W. Fairechio
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Toronto, Ont., Canada
Conference Date: 11 June 2006
Page(s): 428 - 431
ISBN (Paper): 1-4244-0333-2
ISSN (Paper): 1089-084X
DOI: 10.1109/ELINSL.2006.1665349
Regular:

Assessing the condition of medium voltage cable and predicting cable performance is an ongoing effort at Con Edison. Some of our cables have been in use for nearly a century and, although the... View More

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