IEEE - Institute of Electrical and Electronics Engineers, Inc. - Josephson effects in Nb 3 Sn microbridges

Author(s): T. Lee ; C. Falco
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1981
Volume: 17
Page(s): 85 - 87
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/TMAG.1981.1060927
Regular:

We have studied Josephson effects in long narrow Nb3Sn microbridges at temperatures up to 17 K. These microbridges are formed by photolithographic techniques and subsequently subjected to... View More

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