IEEE - Institute of Electrical and Electronics Engineers, Inc. - Distributed dynamic event tree generation for reliability and risk assessment

Proceedings. Challenges of Large Applications in Distributed Environments

Author(s): B. Rutt ; U. Catalyurek ; A. Hakobyan ; K. Metzroth ; T. Aldemir ; R. Denning ; S. Dunagan ; D. Kunsman
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Paris, France
Conference Date: 19 June 2006
Page Count: 10
Page(s): 61 - 70
ISBN (Paper): 1-4244-0420-7
DOI: 10.1109/CLADE.2006.1652056
Regular:

Level 2 probabilistic risk assessments of nuclear plants (analysis of radionuclide release from containment) may require hundreds of runs of severe accident analysis codes such as MELCOR or... View More

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