IEEE - Institute of Electrical and Electronics Engineers, Inc. - QoS reliability of hierarchical clustered wireless sensor networks

25th IEEE International Performance, Computing, and Communications Conference

Author(s): L. Xing ; A. Shrestha
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Phoenix, AZ, USA
Conference Date: 10 April 2006
Page Count: 6
ISBN (Paper): 1-4244-0198-4
DOI: 10.1109/.2006.1629464
Regular:

We consider the problem of reliability modeling and analysis of hierarchical clustered wireless sensor networks (WSN) in this paper. We propose reliability measures that integrate the conventional... View More

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