IEEE - Institute of Electrical and Electronics Engineers, Inc. - Active event correlation in Bro IDS to detect multi-stage attacks

Fourth IEEE International Workshop on Information Assurance

Author(s): Bing Chen ; J. Lee ; A.S. Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: London, UK
Conference Date: 13 April 2006
ISBN (Paper): 0-7695-2564-4
DOI: 10.1109/IWIA.2006.2
Regular:

Many recent computer attacks have been launched in multiple stages to evade the detection of existing intrusion detection systems (IDS). Some stages of the attack may appear innocent if checked... View More

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