IEEE - Institute of Electrical and Electronics Engineers, Inc. - Single event effects as a reliability issue of IT infrastructure

Proceedings. Third International Conference on Information Technology and Applications

Author(s): E. Ibe ; H. Kameyama ; Y. Yahagi ; H. Yamaguchi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Sydney, NSW, Australia
Conference Date: 4 July 2005
Volume: 1
ISBN (Paper): 0-7695-2316-1
DOI: 10.1109/ICITA.2005.254
Regular:

Terrestrial neutron is being recognized as a major source of single event effects (SEEs) including soft-error of semi-conductor devices at the ground level. As semiconductor device scaling... View More

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