IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extended abstract: formal verification of architectural patterns in support of dependable distributed systems

Proceedings. Third ACM & IEEE International Conference on Formal Methods and Models for Co-Design

Author(s): R. Jeffords ; R. Bharadwaj
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Verona, Italy
Conference Date: 11 July 2005
Page Count: 2
Page(s): 243 - 244
ISBN (Paper): 0-7803-9227-2
DOI: 10.1109/MEMCOD.2005.1487924
Regular:

Building robust, secure distributed systems in the presence of transient faults, node failures, and changes in network topology poses a multitude of challenges. To meet current engineering... View More

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