IEEE - Institute of Electrical and Electronics Engineers, Inc. - Worst-case and average-case analysis of n-detection test sets

Proceedings. Design, Automation and Test in Europe

Author(s): I. Pomeranz ; S.M. Reddy
Sponsor(s): European Design and Autom. Assoc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Munich, Germany, Germany
Conference Date: 7 March 2005
ISBN (Paper): 0-7695-2288-2
ISSN (Paper): 1530-1591
DOI: 10.1109/DATE.2005.330
Regular:

Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform both a worst-case... View More

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