IEEE - Institute of Electrical and Electronics Engineers, Inc. - The soft error problem: an architectural perspective

Proceedings. 11th International Symposium on High-Performance Computer Architecture

Author(s): S.S. Mukherjee ; J. Emer ; S.K. Reinhardt
Sponsor(s): IEEE Comput. Soc. Tech. Comm. on Comput. Archit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: San Francisco, CA, USA, USA
Conference Date: 12 February 2005
Page(s): 243 - 247
ISBN (Paper): 0-7695-2275-0
ISSN (Paper): 1530-0897
DOI: 10.1109/HPCA.2005.37
Regular:

Radiation-induced soft errors have emerged as a key challenge in computer system design. If the industry is to continue to provide customers with the level of reliability they expect,... View More

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