IEEE - Institute of Electrical and Electronics Engineers, Inc. - Function testing of bipolar ICs and LSIs with the stroboscopic scanning electron microscope

Author(s): H. Fujioka ; K. Nakamae ; K. Ura
Sponsor(s): IEEE Solid-State Circuits Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1980
Volume: 15
Page(s): 177 - 183
ISSN (Paper): 0018-9200
ISSN (Online): 1558-173X
DOI: 10.1109/JSSC.1980.1051360
Regular:

The functional testing of individual circuits is essential for device manufacturers when integrated circuits have not satisfied design specifications. What is required for the functional testing... View More

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