IEEE - Institute of Electrical and Electronics Engineers, Inc. - BIST Structure for ASIC Circuits

Proceedings. 2006 International Conference on Intelligence For Modelling, Control and Automation. Jointly with International Conference on Intelligent Agents, Web Technologies and Internet Commerce

Author(s): I. Gosciniak
Sponsor(s): IEEE Comput Intelligence Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Vienna, Austria
Conference Date: 28 November 2005
Volume: 1
Page(s): 840 - 845
ISBN (Paper): 0-7695-2504-0
DOI: 10.1109/CIMCA.2005.1631369
Regular:

The paper presents the possibility to use linear modification to build the testing structure for the ASIC SC and GA mask programmable circuits. The proposed conception was verified by simulating... View More

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