IEEE - Institute of Electrical and Electronics Engineers, Inc. - Practical Aspects of Delay Testing for Nanometer Chips

Proceedings. 14th Asian Test Symposium

Author(s): V. Chickermane ; B. Keller ; K. McCauley ; A. Uzzaman
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Calcutta, India
Conference Date: 18 December 2005
Page(s): 470
ISBN (Paper): 0-7695-2481-8
ISSN (Paper): 1081-7735
DOI: 10.1109/ATS.2005.89
Regular:

As SoC feature sizes are moving down to the nanometer range there is an increasing need to develop high quality, cost-effective and sensitive tests for nanometer devices. Many of the newer defects... View More

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