IEEE - Institute of Electrical and Electronics Engineers, Inc. - Loss and the accuracy of the photonic crystal model in holey VCSELs

2005 Conference on Lasers and Electro-Optics (CLEO)

Author(s): A.J. Danner ; J.J. Raftery, Jr. ; P.O. Leisher ; E.A. Yamaoka ; S.R. Lala ; M.L. Hwang ; K.D. Choquette
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Baltimore, MD, USA
Conference Date: 22 May 2005
Volume: 3
Page Count: 2
ISBN (Paper): 1-55752-795-4
DOI: 10.1109/CLEO.2005.202322
Regular:

A comprehensive parametric study of VCSELs incorporating etched holes for lateral confinement was conducted. Results from over two thousand devices reveal the role of loss and verify the... View More

Advertisement