IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Procedure to Assess Total Uncertainty in Characterizing Structural Response

The International Conference on System, Man and Cybernetics

Author(s): T.J. Ross
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Waikoloa, HI, USA
Conference Date: 12 October 2005
Volume: 2
Page(s): 1,530 - 1,534
ISBN (Paper): 0-7803-9298-1
DOI: 10.1109/ICSMC.2005.1571364
Regular:

This paper summarizes an on-going development of a metric to quantify total uncertainty in the validation of a computer code that might be used, for example, to predict the amount of structural... View More

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