IEEE - Institute of Electrical and Electronics Engineers, Inc. - Exploratory Investigations for Intelligent Damage Prognosis using Hidden Markov Models

The International Conference on System, Man and Cybernetics

Author(s): Roshan Rammohan ; M.R. Taha
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Waikoloa, HI, USA
Conference Date: 12 October 2005
Volume: 2
Page(s): 1,524 - 1,529
ISBN (Paper): 0-7803-9298-1
DOI: 10.1109/ICSMC.2005.1571363
Regular:

Structural damage occurs due to structural overloading or due to environmental conditions or combined effects. Extensive research on structural health monitoring, damage diagnosis and damage... View More

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