IEEE - Institute of Electrical and Electronics Engineers, Inc. - Exploratory Investigations for Intelligent Damage Prognosis using Hidden Markov Models
The International Conference on System, Man and Cybernetics
Author(s): | Roshan Rammohan ; M.R. Taha |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 2005 |
Conference Location: | Waikoloa, HI, USA |
Conference Date: | 12 October 2005 |
Volume: | 2 |
Page(s): | 1,524 - 1,529 |
ISBN (Paper): | 0-7803-9298-1 |
DOI: | 10.1109/ICSMC.2005.1571363 |
Regular:
Structural damage occurs due to structural overloading or due to environmental conditions or combined effects. Extensive research on structural health monitoring, damage diagnosis and damage... View More