Resonant Raman X-Ray Scattering: New Directions

Author(s): A. F. Kodre ; S. M. Shafroth
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 1979
Volume: 26
Page(s): 1,062 - 1,067
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1979.4330318



Raman and Resonant Raman x-ray scattering are briefly reviewed. Two recent contributions to the field of resonant Raman x-ray scattering are then described. In the first Resonant Raman x-ray scattering on molybdenum was studied. Beside the usual resonant Raman peak corresponding to the fluorescent KΑ lines another peak with a smaller energy loss was found. It is attributed to resonant Raman scattering with a final state M-shell vacancy corresponding to the fluorescent K+ƒ lines. Both peaks are shown to be independent of the scattering angle. Absolute cross sections have been determined and compared with theoretical predictions. In the second contribution, widths of K vacancy excited states are extracted by measuring the ratio of cross sections for x-ray fluorescence and resonant Raman scattering. Widths of K-vacancy excited states in Zr, Mo, Rh, Ag, and Sn were determined as (4.0 -¦ 0.3) eV, (4.6 -¦ .3) eV, (6.4 -¦ .5) eV, (7.6 -¦ .7) eV and (12.0 -¦ 1.5) eV respectively.