IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of a three-dimensional photonic crystal with point defects at near-infrared wavelengths

Conference on Lasers and Electro-Optics (CLEO)

Author(s): Minghao Qi ; E. Lidorikis ; J.D. Joannopoulos ; H.I. Smith
Sponsor(s): APS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2004
Conference Location: San Francisco, CA, USA
Conference Date: 16 May 2004
Volume: 1
Page Count: 2
ISBN (Paper): 1-55752-777-6
Regular:

A 3D photonic band gap was verified with FTIR microscopy at near-infrared wavelengths for a recently fabricated 3D photonic crystal. For the first time, point-defect states in a 3D photonic... View More

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