IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transverse mode control by etching depth tuning in 1120-nm GaInAs/GaAs photonic crystal vertical-cavity surface-emitting lasers

Conference on Lasers and Electro-Optics (CLEO)

Author(s): Jong-Hwa Baek ; In-Kag Hwang ; Kum-Hee Lee ; Yong-Hee Lee ; Young-Gu Ju ; T. Kondo ; T. Miyamoto ; F. Koyama
Sponsor(s): APS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2004
Conference Location: San Francisco, CA, USA
Conference Date: 16 May 2004
Volume: 1
Page Count: 2
ISBN (Paper): 1-55752-777-6
Regular:

Transverse mode control by etching depth tuning is demonstration from long wavelength (1120 nm) photonics-crystal vertical-cavity surface-emitting lasers. The non-degenerate single-transverse mode... View More

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