IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Analysis and Identification of Flux-Induced Voltage Transients on Low-Loss Transmission Lines with Application to the Lightning-Transient-Analysis (LTA) Problem

Author(s): William S. McCormick
Sponsor(s): IEEE Electromagnetic Compatibility Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 1979
Volume: EMC-21
Page(s): 13 - 19
ISSN (Paper): 0018-9375
ISSN (Online): 1558-187X
DOI: 10.1109/TEMC.1979.303791
Regular:

One of the acknowledged lightning threats to aircraft is the induction threat in which a lightning-induced fuselage skin current inductively or capacitively flux couples through small dielectric... View More

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