IEEE - Institute of Electrical and Electronics Engineers, Inc. - Skin reflectance modelling for face recognition

Proceedings of the 17th International Conference on Pattern Recognition

Author(s): W.A.P. Smith ; A. Robles-Kelly ; E.R. Hancock
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2004
Conference Location: Cambridge, UK
Conference Date: 26 August 2004
Volume: 3
Page Count: 4
ISBN (Paper): 0-7695-2128-2
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2004.1334505
Regular:

We present a parameter-free method for estimating the BRDF of a subject's skin from a single image. We show how the technique can be used for photometric correction as a preprocessing step for... View More

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