IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparison of eigenface-based feature vectors under different impairments

Proceedings of the 17th International Conference on Pattern Recognition

Author(s): A. Pnevmatikakis ; L. Polymenakos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2004
Conference Location: Cambridge, UK
Conference Date: 26 August 2004
Volume: 1
Page Count: 4
ISBN (Paper): 0-7695-2128-2
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2004.1334111
Regular:

We study the performance of a new eigenface-based method for face recognition. Specifically, we perform DCT preprocessing followed by the PCA-LDA combination. We compare the new method to existing... View More

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