IEEE - Institute of Electrical and Electronics Engineers, Inc. - Affine-invariant pattern recognition using momentums in log-polar images

Proceedings. Sixth IEEE International Conference on Automatic Face and Gesture Recognition

Author(s): Young-Ho Son ; Bum-Jae You ; Sang-Rok Oh ; Gwi-Tae Park
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2004
Conference Location: Seoul, South Korea, South Korea
Conference Date: 19 May 2004
Page Count: 6
Page(s): 797 - 802
ISBN (Paper): 0-7695-2122-3
DOI: 10.1109/AFGR.2004.1301632
Regular:

Log-polar images are useful in the sense that their image data size is reduced dramatically comparing with conventional images and it is possible to develop faster pattern recognition algorithms.... View More

Advertisement