IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing high-speed serial interface technology: is your test solution in synch?

28th International Electronics Manufacturing Technology Symposium

Author(s): S. Lomaro
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: San Jose, CA, USA, USA
Conference Date: 16 July 2003
Page Count: 2
Page(s): 437 - 438
ISBN (Paper): 0-7803-7933-0
ISSN (Paper): 1089-8190
DOI: 10.1109/IEMT.2003.1225940
Regular:

High-speed serial interface technology provides orders of magnitude improvement in device-to-device data transfer rates. Some interfaces are based on the use of clock forwarding-also known as... View More

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