IEEE - Institute of Electrical and Electronics Engineers, Inc. - Overcoming test challenges presented by embedded flash memory

28th International Electronics Manufacturing Technology Symposium

Author(s): J. Agin ; H. Boyce ; T. Trexler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: San Jose, CA, USA, USA
Conference Date: 16 July 2003
Page Count: 4
Page(s): 197 - 200
ISBN (Paper): 0-7803-7933-0
ISSN (Paper): 1089-8190
DOI: 10.1109/IEMT.2003.1225899
Regular:

In providing non-volatile storage, embedded flash memory has emerged as a key component in consumer appliances like DVD players and set top boxes as well as mobile applications including cellular... View More

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