IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transient analysis of nonlinear microwave circuits using small-signal scattering parameters

IEEE Radio Frequency Integrated Circuits Symposium (RFIC)

Author(s): Pingshan Wang ; V.S. Kaper ; S.J. Richard ; E.C. Kan
Sponsor(s): IEEE Microwave Theory & Tech. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Philadelphia, PA, USA, USA
Conference Date: 9 June 2003
Page Count: 4
Page(s): 361 - 364
ISBN (Paper): 0-7803-7694-3
ISSN (Paper): 1529-2517
DOI: 10.1109/RFIC.2003.1213962
Regular:

A transient analysis method for nonlinear microwave circuit analysis is described in this paper. S-parameter microwave circuit theory and measurement-based small-signal scattering parameters of... View More

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