IEEE - Institute of Electrical and Electronics Engineers, Inc. - Heuristics for finding concurrent bugs

International Parallel and Distributed Processing Symposium (IPDPS 2003)

Author(s): Y. Eytani ; E. Farchi ; Y. Ben-Asher
Sponsor(s): IEEE Comput. Soc Tech. Committee on Parallel Process.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Nice, France, France
Conference Date: 22 April 2003
Page Count: 8
ISBN (Paper): 0-7695-1926-1
ISSN (Paper): 1530-2075
DOI: 10.1109/IPDPS.2003.1213514
Regular:

This paper presents new heuristics that increase the probability of manifesting concurrent bugs. The heuristics are based on cross-run monitoring. A contended shared variable is chosen and random... View More

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