IEEE - Institute of Electrical and Electronics Engineers, Inc. - Disassembly AND/OR graph model for "disassembly for recycling"

Conference Record. 2003 IEEE International Symposium on Electronics and the Environment

Author(s): Jiangang Gao ; Dong Xiang ; Haifeng Chen ; Guanghong Duan ; Jinsong Wang
Sponsor(s): IEEE Comput. Soc., Tech. Committee on Electron. Environ.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Boston, MA, USA, USA
Conference Date: 19 May 2003
Page Count: 6
Page(s): 54 - 59
ISBN (Paper): 0-7803-7743-5
ISSN (Paper): 1095-2020
DOI: 10.1109/ISEE.2003.1208047
Regular:

There exists combination explosion during the course of modeling of AND/OR graph for disassembly planning for recycling, which makes it nearly impossible to handle a product with numerous parts.... View More

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