IEEE - Institute of Electrical and Electronics Engineers, Inc. - System and framework for QA of process design kits
ISQED 2003: 4th International Symposium on Quality Electronic Design
Author(s): | M.C. Scott ; M.O. Peralta ; J.D. Carothers |
Sponsor(s): | IEEE Electron Device Soc. (EDS) |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 2003 |
Conference Location: | San Jose, CA, USA, USA |
Conference Date: | 24 March 2003 |
Page Count: | 6 |
Page(s): | 138 - 143 |
ISBN (Paper): | 0-7695-1881-8 |
DOI: | 10.1109/ISQED.2003.1194722 |
Regular:
In this paper, we evaluate the dependencies between tools, data and environment in process design kits. and present a framework for systematically analyzing the quality of the design tools and... View More