IEEE - Institute of Electrical and Electronics Engineers, Inc. - System and framework for QA of process design kits

ISQED 2003: 4th International Symposium on Quality Electronic Design

Author(s): M.C. Scott ; M.O. Peralta ; J.D. Carothers
Sponsor(s): IEEE Electron Device Soc. (EDS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: San Jose, CA, USA, USA
Conference Date: 24 March 2003
Page Count: 6
Page(s): 138 - 143
ISBN (Paper): 0-7695-1881-8
DOI: 10.1109/ISQED.2003.1194722
Regular:

In this paper, we evaluate the dependencies between tools, data and environment in process design kits. and present a framework for systematically analyzing the quality of the design tools and... View More

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