IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effect of RAM amount on the thermal behavior of CPU operating under a heavy computational load

Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Author(s): M. Naghedolfeizi ; S. Arora ; S. Garcia ; N. Yousif
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: San Jose, CA, USA, USA
Conference Date: 11 March 2003
Page Count: 4
Page(s): 156 - 159
ISBN (Paper): 0-7803-7793-1
ISSN (Paper): 1065-2221
DOI: 10.1109/STHERM.2003.1194355
Regular:

The purpose of this research was to investigate the effects of different RAM amount and fan failure on bulk CPU temperature rises while operating under a heavy computational load. Two sets of... View More

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