IEEE - Institute of Electrical and Electronics Engineers, Inc. - Screen characterization under fan induced swirl conditions

Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Author(s): K. Nevelsteen ; M. Baelmans ; K. De Troch ; M. Mesbah ; W. Nelemans
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: San Jose, CA, USA, USA
Conference Date: 11 March 2003
Page Count: 7
Page(s): 1 - 7
ISBN (Paper): 0-7803-7793-1
ISSN (Paper): 1065-2221
DOI: 10.1109/STHERM.2003.1194332
Regular:

In this paper, loss coefficients for a fine and a coarse EMC screen placed in a swirling flow are determined. In an axis-symmetric swirl generator test rig the screen performance is measured under... View More

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