IEEE - Institute of Electrical and Electronics Engineers, Inc. - Efficient preimage computation using a novel success-driven ATPG

6th Design Automation and Test in Europe (DATE 03)

Author(s): Shuo Sheng ; M. Hsiao
Sponsor(s): EDAA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Munich, Germany, Germany
Conference Date: 7 March 2003
Page Count: 6
Page(s): 822 - 827
ISBN (Paper): 0-7695-1870-2
ISSN (Paper): 1530-1591
DOI: 10.1109/DATE.2003.1253708
Regular:

Preimage computation is a key step in formal verification. Pure OBDD-based symbolic method is vulnerable to the space-explosion problem. On the other hand, conventional ATPG/SAT-based method can... View More

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