IEEE - Institute of Electrical and Electronics Engineers, Inc. - High speed and highly testable parallel two-rail code checker

6th Design Automation and Test in Europe (DATE 03)

Author(s): M. Omana ; D. Rossi ; C. Metra
Sponsor(s): EDAA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Munich, Germany, Germany
Conference Date: 7 March 2003
Page Count: 6
Page(s): 608 - 613
ISBN (Paper): 0-7695-1870-2
ISSN (Paper): 1530-1591
DOI: 10.1109/DATE.2003.1253675
Regular:

In this article, we propose a high speed and highly testable parallel two-rail code checker, which features a compact structure and is totally-self-checking or strongly code-disjoint with... View More

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