IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transmission line pulsed photo emission microscopy as an ESD troubleshooting method

2003 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

Author(s): J. van Zwol ; W. Kemper ; P. Bruin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2003
Conference Location: Las Vegas, NV, USA
Conference Date: 21 September 2003
Page(s): 1 - 8
ISBN (CD): 978-1-5853-7057-3
Regular:

Standard or transmission line pulse ESD testing combined with failure analysis will not always reveal the cause of ESD weakness in an IC. The paper proposes the combination of photo emission... View More

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