IEEE - Institute of Electrical and Electronics Engineers, Inc. - Feature extraction method of EEG waves under visual recognition task

SICE 2002. Proceedings of the 41st SICE Annual Conference

Author(s): K. Inoue ; K. Kumamaru ; R. Yano ; A. Hayashi ; A. Yamauchi ; S. Matsuoka
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2002
Conference Location: Osaka, Japan
Conference Date: 5 August 2002
Volume: 1
Page Count: 3
ISBN (Paper): 0-7803-7631-5
DOI: 10.1109/SICE.2002.1195233
Regular:

In this paper, the feature extraction method of ERP (event-related potential) under the visual recognition task was investigated. First, visual oddball experiments were executed. We examined the... View More

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