IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault diagnosis based on intelligent information processing technology

IEEE TENCOM'02. 2002 IEEE Region 10 Conference on Computer, Communications, Control and Power Engineering

Author(s): Peng Tao ; Gui Weihua ; Wu Min ; Xie Yong ; Tang Zhaohui
Sponsor(s): IEEE Region 10
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2002
Conference Location: Beijing, China, China
Conference Date: 28 October 2002
Volume: 3
Page Count: 5
ISBN (Paper): 0-7803-7490-8
DOI: 10.1109/TENCON.2002.1182663
Regular:

This paper proposes a fault diagnosis method based on intelligent information processing technology. It first extracts the characteristics of the primary sample signals with wavelet transforms,... View More

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