IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Microprocessor-Based Solar Cell Test System

Author(s): Ronald Schultz ; Algis A. Meilus ; Sung C. Hu ; Chandra Goradia
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1977
Volume: 26
Page(s): 295 - 299
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/TIM.1977.4314562
Regular:

The electrical behavior of a solar cell is completely characterized by its current versus voltage (I-V) curve. To obtain this curve, the voltage across the solar cell may be continuously or... View More

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