IEEE - Institute of Electrical and Electronics Engineers, Inc. - Process diagnostics

Proceedings of 26th Annual International Computer Software and Applications

Author(s): V.S. Phanindra ; M. Murugappan ; G. Keeni
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2002
Conference Location: Oxford, UK, UK
Conference Date: 26 August 2002
Page Count: 4
Page(s): 734 - 737
ISBN (Paper): 0-7695-1727-7
ISSN (Paper): 0730-3157
DOI: 10.1109/CMPSAC.2002.1045089
Regular:

Process monitoring and its close scrutiny is the only mechanism to keep the process under statistical control, thereby ensuring product quality. The most optimum and cost effective tools to... View More

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