IEEE - Institute of Electrical and Electronics Engineers, Inc. - Use of Interface Waves for Nondestructive Inspection

Author(s): D.A. Lee ; D.M. Corbly
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 1977
Volume: 24
Page(s): 206 - 211
ISSN (Paper): 0018-9537
DOI: 10.1109/T-SU.1977.30930
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