IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using fit-constrained Monte Carlo trials to quantify confidence in simulation model outcomes

Proceedings of the 35th Annual Hawaii International Conference on System Sciences

Author(s): A.K. Graham ; C.Y. Choi ; T.W. Mullen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2002
Conference Location: Big Island, HI, USA
Conference Date: 10 January 2002
Page Count: 9
ISBN (Paper): 0-7695-1435-9
DOI: 10.1109/HICSS.2002.994028
Regular:

System dynamics-based simulation models are useful for analyzing complex systems characterized by both large parameter spaces and pervasive nonlinearity. Unfortunately, these characteristics also... View More

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