IEEE - Institute of Electrical and Electronics Engineers, Inc. - Variance reduction in aged sample data by the use of lot acceptance test data [missile primary cell testing]

Seventeenth Annual Battery Conference on Applications and Advances

Author(s): J. Freeland
Sponsor(s): AIAA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2002
Conference Location: Long Beach, CA, USA, USA
Conference Date: 18 January 2002
Page Count: 4
Page(s): 265 - 268
ISBN (Paper): 0-7803-7132-1
ISSN (Paper): 1089-8182
DOI: 10.1109/BCAA.2002.986412
Regular:

NAVSEA Crane Division performs ongoing quality evaluation test (QET) programs to evaluate the steady deterioration with age of critical performance parameters (such as risetime and runtime) of... View More

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