IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dissipation in Solid-State Devices--The Magic of I l + N

Author(s): William E. Newell
Sponsor(s): IEEE Industry Applications Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 1976
Volume: IA-12
Page(s): 386 - 396
ISSN (Paper): 0093-9994
ISSN (Online): 1939-9367
DOI: 10.1109/TIA.1976.349442
Regular:

The current capacity of a solid-state device, as ordinarily rated, varies widely depending on the current waveform, duty cycle, case temperature, etc. The underlying junction temperature limits... View More

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